Maximizing Area-constrained Partial Fault Tolerance in Reconfigurable Logic Using Selection Criteria
Document Type
Article
Publication Date
1-1-2013
Publication Title
International Journal of Embedded Systems
Abstract
As field programmable gate arrays find increasing use in aerospace and terrestrial applications, a number of methods of fault tolerance have been developed to ensure reliable operation. Most current techniques output the required circuit area based on the desired level of fault tolerance with some techniques increasing the area by over 200%. In deployed systems, however, the FPGA is fixed and the area available for adding fault tolerance is limited. As a consequence, protecting an updated, larger circuit using the same fault tolerance scheme may result in a design that no longer fits in the deployed FPGA. This situation dictates the need for area-aware techniques that can trade fault tolerance for lower area penalties. The open question with these approaches is partitioning the circuit into protected and unprotected subsets to maximise the fault coverage. This paper presents several methodologies for selecting subsets and analyses their performances on several circuits based on fault coverage provided, additional latency, and running times.
Volume
5
Issue
1/2
First Page
81
Last Page
94
DOI
https://doi.org/10.1504/IJES.2013.052146
ISSN
1741-1068
Rights
© 2013 Inderscience
Recommended Citation
Foster, David L. and Hanna, Darrin M., "Maximizing Area-constrained Partial Fault Tolerance in Reconfigurable Logic Using Selection Criteria" (2013). Electrical & Computer Engineering Publications. 39.
https://digitalcommons.kettering.edu/electricalcomp_eng_facultypubs/39
Comments
ESSN: 1741-1076