Title

Back diffusion of electrons in N2 subjected to crossed fields

Document Type

Conference Proceeding

Publication Date

10-18-2015

Publication Title

IEEE Xplore

Conference Name

2015 IEEE Conference on Electrical Insulation and Dielectric Phenomena

Abstract

In the E/N range of 50 Td - 700 Td (1 Td = 10 -21 Vm 2 ), the back diffusion process for nitrogen subjected to crossed fields are investigated at B/N values ranging from 0 to 24.24 × 10 -25 Tm 3 by means of a Monte Carlo technique employing realistic collision cross sections. It is observed that at constant electron emission energy of 1.0 eV, for a given E/N the escape factor decreases as B/N increases. It is also observed that in the lower E/N range in crossed fields the escape factor is smaller than those of the higher E/N range. The escape factor on the magnetic deflection angle is evaluated and a dependence on the magnetic field is observed in crossed fields in the given ranges of E/N and B/N.

Comments

Ann Arbor, MI, USA

Rights Statement

This is a RoMEO green publisher - Must link to publisher version

© Copyright 2015 IEEE

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