Back diffusion of electrons in N2 subjected to crossed fields

Document Type

Conference Proceeding

Publication Date


Publication Title

IEEE Xplore

Conference Name

2015 IEEE Conference on Electrical Insulation and Dielectric Phenomena


In the E/N range of 50 Td - 700 Td (1 Td = 10 -21 Vm 2 ), the back diffusion process for nitrogen subjected to crossed fields are investigated at B/N values ranging from 0 to 24.24 × 10 -25 Tm 3 by means of a Monte Carlo technique employing realistic collision cross sections. It is observed that at constant electron emission energy of 1.0 eV, for a given E/N the escape factor decreases as B/N increases. It is also observed that in the lower E/N range in crossed fields the escape factor is smaller than those of the higher E/N range. The escape factor on the magnetic deflection angle is evaluated and a dependence on the magnetic field is observed in crossed fields in the given ranges of E/N and B/N.


Ann Arbor, MI, USA

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