Physical Review B
We have synthesized a series of zirconium nitride–aluminum nitride multilayers with a reactive sputtering technique. Structure and elastic response of these multilayers are characterized by x-ray-diffraction and transient piezoreflectance measurements. We observe a systematic decrease of the longitudinal elastic response in the direction of film growth as the composition modulation wavelength decreases. This contradicts a recent model of elastic response which predicts the absence of elastic anomaly in metal-insulator multilayers.
Svinarich, Kathryn A.; Eesley, G. L.; and Meng, W. J., "Structural and Elastic Properties of Zirconium Nitride-Aluminum Nitride Multilayers" (1990). Physics Publications. 1.