Document Type

Article

Publication Date

9-1-1990

Publication Title

Physical Review B

Abstract

We have synthesized a series of zirconium nitride–aluminum nitride multilayers with a reactive sputtering technique. Structure and elastic response of these multilayers are characterized by x-ray-diffraction and transient piezoreflectance measurements. We observe a systematic decrease of the longitudinal elastic response in the direction of film growth as the composition modulation wavelength decreases. This contradicts a recent model of elastic response which predicts the absence of elastic anomaly in metal-insulator multilayers.

DOI

http://dx.doi.org/10.1103/PhysRevB.42.4881

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